| 摘要 |
PURPOSE:To attain automatically and instantly detection without using any measuring instrument by detecting a fault with a function test of a built-in microprocessor to attain display. CONSTITUTION:A microprocessor 11 which controls memories 12-15 incorporated in an automobile telephone set and circuits such as input/output interfaces 16, 17 conducts the functional test of the memories 12-15 and the circuits of the interfaces 16, 17 in order, and displays the result of the functional test on a display device. Thus, the detection is performed automatically and instantly without using an exclusive measuring instrument for fault detection. |
