发明名称 Defect-remediable semiconductor integrated circuit memory and spare substitution method in the same
摘要 An LSI memory comprises a memory array including usual memory cells arranged in a matrix form, usual address transistors for selecting usual lines connected to the columns or rows of the memory array, address lines for controlling the usual address transistors, spare memory cells provided in the memory array, a spare line connected to the spare memory cells, spare address transistors connected between the address lines and the spare lines, and nonvolatile memory elements connected between the sources of the spare address transistors and the ground. By putting any one of the nonvolatile memory elements into the written state, any one of the spare address transistors are conditioned into an active state so that the spare line can be substituted for a defective usual line.
申请公布号 US4514830(A) 申请公布日期 1985.04.30
申请号 US19820344974 申请日期 1982.02.02
申请人 HITACHI, LTD. 发明人 HAGIWARA, TAKAAKI;HORIUCHI, MASATADA;KONDO, RYUJI;YATSUDA, YUJI;MINAMI, SHINICHI
分类号 H01L27/112;G11C29/00;G11C29/04;H01L21/8246;H01L21/8247;H01L29/788;H01L29/792;(IPC1-7):G11C11/40 主分类号 H01L27/112
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