发明名称 |
Scanning transmission electron microscopes |
摘要 |
In a scanning transmission electron microscope 1 the image of the diffraction pattern formed on a phosphor screen 6 as a result of electron beam impingement on a point on the specimen 4 is converted by a camera 7 into a video signal and digitized in an ADC convertor 9 and stored in a digital store 10. The stored signal is then modified by a weighting factor representing a notional pattern overlaying screen 6. The weighting factor may have one of two binary values, representing a notional opaque and transparent pattern, or may have a multiplicity of different values. The modified signals are then added together to provide a picture value for the point of impingement. By this means a complete picture is built up point-by-point. To speed up the picture taking operation diffraction images from different points may be displayed on different parts of screen 6 so that several images can be scanned together by camera 7.
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申请公布号 |
US4514629(A) |
申请公布日期 |
1985.04.30 |
申请号 |
US19830509054 |
申请日期 |
1983.06.29 |
申请人 |
NATIONAL RESEARCH DEVELOPMENT CORPORATION |
发明人 |
SMITH, KENNETH C. A.;ERASMUS, STEPHEN J. |
分类号 |
H01J37/295;H01J37/22;H01J37/28;(IPC1-7):G01N23/00 |
主分类号 |
H01J37/295 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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