发明名称 Integral plastic masked semiconductor or - thick film ic
摘要 The mask is of etch resistant, temperature resistant and light insensitive plastic and the pattern of cut outs, in necessary regions, is formed in the plastic layer by electron beam machining, these cut outs being used subsequently for the addition or removal further material to or from the body. The plastic film may be between approx. 1 micron and a few tenths of a millimetre thick and be of PTFe or polyurethane sprayed on to the semiconductor body.
申请公布号 DE1918490(A1) 申请公布日期 1971.02.18
申请号 DE19691918490 申请日期 1969.04.11
申请人 LICENTIA PATENT-VERWALTUNGS-GMBH 发明人 STORK,FRITZ
分类号 H01L21/00;H01L21/20;H01L23/29;H01L23/522;H01L49/02;H05K3/00 主分类号 H01L21/00
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