发明名称 |
OPTICAL EXPOSURE APPARATUS |
摘要 |
An optical exposure apparatus in which a predetermined pattern is projected on a workpiece through an exposure lens and an alignement mark formed on the workpiece is detected through a projecting lens. It is desirable that the detected waveform of the alignement mark should not be deformed. Deformation of the waveform is caused by the interference of alignement light; therefore, to reduce the interference, light of a first wavelength and light of a second wavelength are employed as alignement light. |
申请公布号 |
WO8501834(A1) |
申请公布日期 |
1985.04.25 |
申请号 |
WO1984JP00467 |
申请日期 |
1984.10.03 |
申请人 |
HITACHI, LTD. |
发明人 |
SUGIYAMA, SHUJI;SHODA, SHUJI;KUNIYOSHI, SHINJI |
分类号 |
G03F9/00;H01L21/027;H01L21/30;(IPC1-7):H01L21/30 |
主分类号 |
G03F9/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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