| 摘要 |
PURPOSE:To realize a measuring instrument control system in which modification and addition of test functions are easy by controlling plural measuring instruments through the hierarchy constitution of a test individual controller performing the hardware control corresponding to each measuring instrument and a test common controller performing scheduling of test execution and supervision for the test individual controller. CONSTITUTION:The test individual controllers 17-1, 17-2, 17-3 are provided respectively with functions corresponding to measuring instruments 13-1, 13-2, 13-3 and controlling the hardware respectively. When the central processing system 11 receives an external test request, the device 11 analyzes the kind of test request, converts the type of the said test into a command arranged with the test common controller 16 and transmits it to the said test common controller 16. The test common controller 16 analyzes the received command, decides which measuring instrument is to be used among the measuring instruments 13-1, 13-2, 13-3, and checks, e.g., the test individual controller 17-1 corresponding to the measuring instrument 13-1 among the said measuring devices and decides whether the said measuring instrument 13-1 is idle or in use, and normal or faulty. |
