| 摘要 |
PURPOSE:To shorten sharply a rise time suitable for a manufacturing spot and to reduce a production cost and to enable the titled bubble memory tester to be used also for experiment and characteristic measuring by limiting the kind of apparatus to be used, fixing the sequence of tests, but changing data for test conditions in each test. CONSTITUTION:An output read out from a bubble memory 30 is detected by a bubble detecting part 23 and compared and decided with a write data pattern by a comparing and deciding part 24 and the result is sent to a control part 13. If the result is valid, the control part 13 advances the sequence data, reads out the succeeding test conditions from a test condition storage part 16 or the like and sets up the conditions in a program power source 17 and a timing generator 20 to drive a bubble memory 30. Since the bubble memory tester is exclusively used for only one kind of apparatus, data such as sequence data, write/read data and a data pattern are fixed data, but current values of respective gates and the test conditions can be varied. Consequently, the critical conditions of a bubble memory to be tested are searched out. |
