发明名称 EVALUATING METHOD OF THIN FILM MATERIAL FOR HEAD
摘要 PURPOSE:To improve the yield rate of indefectible goods in head production by discriminating whether the Barkhausen phenomenon exists or not to evaluate a permeability magnetic thin film as it is and detecting the cause of a noise abnormality of the thin film before the thin film is worked into a head. CONSTITUTION:The surface of a permeability magnetic thin film 2 which is laminated on a nonmagnetic plane substrate 1 and is a sample to be detected is brought into contact with a gap part 4 of what is called a ring-type head 3, and a signal electromotive force induced in a coil 5 of this ring head 3 is displayed on an oscilloscope 10 through an amplifier 9. The fing-type head 3 is incorporated in a sample plating table 6. The sample to be examined and the ring-type head 3 are placed in center parts of Helmholtz coils 7 and 7', and an AC or DC magnetic field is impressed to them by an external power source 8. By this constitution, an impulsive noise signal is displayed on the oscilloscope 10 if the Barkhausen phenomenon is caused in the sample magnetic film 2, and thus, the sample magnetic film 2 is evaluated easily to be defective goods.
申请公布号 JPS6069810(A) 申请公布日期 1985.04.20
申请号 JP19830177317 申请日期 1983.09.26
申请人 MATSUSHITA DENKI SANGYO KK 发明人 NAKAYAMA YASUHIKO;FURUYA NOBUAKI
分类号 G01R33/12;G11B5/31;G11B5/455;(IPC1-7):G11B5/455 主分类号 G01R33/12
代理机构 代理人
主权项
地址