发明名称 TEST-ITEM INSTRUCTING SYSTEM
摘要 PURPOSE:To improve workability, by instructing the contents of operation by a display circuit, and knowing the completion and non-completion of the instructed contents of the operation. CONSTITUTION:Display units 3 and 3' are connected to external units 2 and 2' by interface cables 7 and 7'. A main body 1 of a testing machine turns ON light emitting diodes and the like provided in the units 3 and 3', and instructs the test items in work cards inserted in the unit 3 and 3'. Meanwhile, the operator operates the operating parts of devices under test 5 and 5' according to the instructed test items of the work cards in the units 3 and 3'. The result of the operation is reported to the main body 1 by switches 4 and 4'.
申请公布号 JPS6064218(A) 申请公布日期 1985.04.12
申请号 JP19830172418 申请日期 1983.09.19
申请人 FUJITSU KK 发明人 TSUCHIYA HIDEAKI
分类号 G01R31/00;G01D21/00 主分类号 G01R31/00
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