发明名称 Process for etching deep trenches in silicon wafers having a flat surface
摘要 Along with the improved process for etching deep trenches in smooth silicon wafers using photomasks, the provision of a silicon oxide layer as adhesion promoter is proposed in order to improve the adhesion of the photoresist. The silicon oxide layer is produced by applying and dispersing a solution of adhesion promoter composed of alkoxysilanols and drying in air and then in a drying oven.
申请公布号 DE3334095(A1) 申请公布日期 1985.04.11
申请号 DE19833334095 申请日期 1983.09.21
申请人 BROWN,BOVERI & CIE AG 发明人 POPP,GERHARD,DIPL.-PHYS.DR.;BINDER,HORST;ROSSINELLI,MARCO,DIPL.-PHYS.DR.
分类号 H01L21/308;H01L21/312;H01L21/78;(IPC1-7):H01L21/78;H01L21/302 主分类号 H01L21/308
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