发明名称 INCIRCUIT TESTER
摘要 PURPOSE:To discriminate whether an element to be measured or contacting of a used contact pin is defective by testing switching from a measuring circuit to a continuity test circuit. CONSTITUTION:Lead wires of contact pins P1-P3 of a print board package are so constituted that they can be switched from contacts B1-B3 for the measuring circuit of an incircuit tester ICT to contacts M1-M3 for the continuity test circuit by changeover switches S1-S3. If an infinite value is indicated in case of measurement of a resistance element Rx to be measured, the contact of the switch S1 is switched from the contact B1 to the contact M1 to apply a voltage of an AC power source EA. A true contacting defect is discriminating if the needle of an ammeter 1A is not deflected, but contacting is good if a current is flowed. It is confirmed whether contacting of all contact pins used for measurement is good or not, and difference between contacting defect or not of contact pins and defect or not of the element to be measured is clarified.
申请公布号 JPS6063474(A) 申请公布日期 1985.04.11
申请号 JP19830145512 申请日期 1983.08.09
申请人 FUJITSU KK 发明人 WADA KAZUHIKO;TATENO HARUNOBU;UCHIDA KENJI
分类号 G01R31/28;(IPC1-7):G01R31/28 主分类号 G01R31/28
代理机构 代理人
主权项
地址