发明名称 DETECTING METHOD OF MICROCRACK OF VESSEL FOR SEMICONDUCTOR DEVICE
摘要 PURPOSE:To detect a microcrack in a semiconductor vessel by visually observing a different between the times when a volatile solvent mainly comprising alcohol or fluorocarbon volatilizes from a microcrack section and a plane by projecting oblique rays. CONSTITUTION:When a predetermined volatile solvent 2 is applied on the surface of a vessel to be tested and the solvent is heated up to a point close by the boiling point of the solvent 2 and volatilized, the volatile solvent 2 generally remains in a crack section. Since reflectivity and reflection angles to oblique rays 5 differ in a normal section 3 in ceramics 1 as the surface of the vessel and the crack sections 4, in which the solvent 2 remains, at that time, reflected rays 6, 7 are generated, and the cracks 4 are detected easily by a visual observation.
申请公布号 JPS6062132(A) 申请公布日期 1985.04.10
申请号 JP19830171461 申请日期 1983.09.16
申请人 MITSUBISHI DENKI KK 发明人 OOSAKA SHIYUUICHI
分类号 G01B11/30;H01L21/66 主分类号 G01B11/30
代理机构 代理人
主权项
地址