发明名称 Dual level pattern recognition system.
摘要 <p>A pattern recognition system has both coarse and fine levels of analysis in which a coarse array representation of a workpiece pattern is formed and used to identify the workpiece pattern as either a reference character or as a member of an ambiguous set of reference characters which are represented by identical coarse array representations. At least portions of a fine array representation of a workpiece pattern which has been classified as a member of a set of reference characters are compared to corresponding portions of fine array representations of reference characters in the set identified by the classification. The pattern recognition system has a learning system through which reference characters may be introduced into the recognition system and through which a representation of a workpiece pattern which was not identified may be incorporated into an existing set of reference characters of the recognition , system.</p>
申请公布号 EP0136718(A2) 申请公布日期 1985.04.10
申请号 EP19840111901 申请日期 1984.10.04
申请人 WANG LABORATORIES INC. 发明人 WANG, PATRICK S.
分类号 G06K9/62;G06K9/68;G06T7/00;(IPC1-7):G06K9/62 主分类号 G06K9/62
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