MATERIAL EVALUATING DEVICE

摘要

PURPOSE:To evaluate various electronic materials by detecting a transient photoconduction phenomenon due to pulse light excitation while varying the measurement temperature of a sample continuously. CONSTITUTION:The sample 2 to be measured which is put in a sample cavity 1 is excited with pulse light from a light source 3. The transient photoconduction phenomenon due to the pulse light excitation is detected by a microwave photoconduction measuring device A. This measuring device A consists of a temperature measuring part 4 which measures the temperature of the sample 2 to be measured, a measured temperature information output part 5 which outputs measured temperature information as an electric signal, and a temperature control part 6 which makes a continuous temperature sweep. The sample 2 is cooled temporarily and then brought under the temperature control of the temperature control part 6 to rise in temperature continuously, measuring the transient photoconduction phenomenon on real-time basis. This microwave photoconduction measuring device is used to evaluate various electronic materials.