MATERIAL EVALUATING DEVICE

摘要

PURPOSE:To evaluate various electronic materials by detecting a transient photoconduction phenomenon due to pulse light excitation while varying the measurement temperature of a sample continuously. CONSTITUTION:The sample 2 to be measured which is put in a sample cavity 1 is excited with pulse light from a light source 3. The transient photoconduction phenomenon due to the pulse light excitation is detected by a microwave photoconduction measuring device A equipped with a temperature control part 6 capable of a continuous temperature sweep. The sample 2 is cooled temporarily and then brought under the temperature control of the temperature control part 6 to rise in temperature continuously, measuring the transient photoconduction phenomenon on real-time basis. A time-series electric signal regarding the transient photoconduction phenomenon is outputted from the measuring device A and supplied to a waveform processor B for waveform processing. Thus, various electronic materials are evaluated.