发明名称 Semiconductor integrated circuit devices with protective means against overvoltages
摘要 An additional N+ region is provided in a P type substrate adjacent to a protective N+ resistor region with an insulating layer and metal layer interposed between the N+ region and the N+ resistor region. The N+ resistor region, the oxide layer, the polysilicon layer and N+ region constitute an MOS transistor, respectively corresponding to a drain region, a gate insulating layer, a gate electrode and a source region of the MOS transistor. When a very high excessive voltage that otherwise would destroy the PN junction between the substrate and the resistor region is applied to the input terminal, the MOS transistor is rendered conductive and the excessive voltage is absorbed.
申请公布号 US4509067(A) 申请公布日期 1985.04.02
申请号 US19820354397 申请日期 1982.03.03
申请人 TOKYO SHIBAURA DENKI KABUSHIKI KAISHA 发明人 MINAMI, KENJI;KATAGIRI, MASARU;NOGUCHI, HIDEO
分类号 H03F1/52;H01L21/8234;H01L27/02;H01L27/06;H01L27/08;H01L27/088;H01L29/66;H01L29/78;H02H7/20;H03F1/42;(IPC1-7):H01L29/90 主分类号 H03F1/52
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