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发明名称
METHOD FOR MEASURING CAPACITY VALUE OF SEMICONDUCTOR VARIABLE CAPACITY ELEMENT
摘要
申请公布号
JPS6055272(A)
申请公布日期
1985.03.30
申请号
JP19830163578
申请日期
1983.09.06
申请人
SEIKO DENSHI KOGYO KK
发明人
MATSUZAKI RIYUUICHI
分类号
G01R31/26;G01R27/26;G04G3/00
主分类号
G01R31/26
代理机构
代理人
主权项
地址
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