发明名称 SYSTEM FOR TESTING FAILURE OR GOOD FUNCTIONING OF A CIRCUIT CONSISTING OF LOGIC COMPONENTS
摘要 The invention relates to a system for testing the malfunctioning or correct operation of a circuit with n logic components. These components respectively present a simulation input receiving a malfunctioning or correct operation simulation signal. The system is characterized in that it comprises test means for placing each component respectively in a state of malfunctioning or of correct operation and vice versa, for one or more combinations of the components of the circuit, the test means present a characteristic output which furnishes a signal of which the logic level depends on the state of malfunctioning or of correct operation and vice versa, of each of the components of the circuit. Finally, the system comprises stop means for stopping the test means when the tests to be carried out are finished. The invention is more particularly applied to tests of electronic circuits and, by analogy, to tests of hydraulic circuits.
申请公布号 DE3262367(D1) 申请公布日期 1985.03.28
申请号 DE19823262367 申请日期 1982.03.04
申请人 COMMISSARIAT A L'ENERGIE ATOMIQUE ETABLISSEMENT DE CARACTERE SCIENTIFIQUE TECHNIQUE ET INDUSTRIEL 发明人 LAVIRON, ANDRE;BERARD, CLAUDE
分类号 G01R31/28;G01R31/317;G01R31/319;G06F17/50;H03K19/00;(IPC1-7):G01R31/28 主分类号 G01R31/28
代理机构 代理人
主权项
地址