| 摘要 |
<p>PURPOSE:To obtain the semiconductor integrated circuit device with which various informations pertaining to the result of evaluation can be recorded and they are utilized effectively by a method wherein, besides the ordinary functioning circuit having the prescribed function, a nonvolatile evaluation result memory storage wherein the evaluation result of the ordinary functioning circuit will be memorized is provided. CONSTITUTION:When the ordinary functioning mode is designated by a mode switching pin 8, mode switching circuits 7a and 7b select input-output pins 4a and 4b. As a result, an ordinary functioning circuit 2 is brought into the state wherein the transfer of data can be performed between the circuit 2 and the external circuit of a semiconductor integrated circuit device 1. Thus the title device starts its intrinsic function. When an evaluation mode is designated by a mode switching pin 8, the mode switching circuits 7a and 7b select input-output pins 6a and 6b respectively. As a result, the transfer of data can be made between the evaluation result memory storage 5 and the external circuit. At this time, when a voltage higher than the source voltage is applied to a write-in control line 10, the evaluation result memory storage 5 is turned to a writable state, and the data pertaining to the result of evaluation given by the semiconductor testing device can be memorized.</p> |
