发明名称 Measuring system based on the triangulation principle for the dimensional inspection of an object.
摘要 <p>An apparatus for the rapid and accurate dimensional inspection of an object. In particular, the apparatus is adapted for the acquisition of object range data. The apparatus includes a source for emitting a slender beam of radiation, first beam guide means (2) for causing the beam to impinge on a desired spot P of the object under inspection, second beam guide means (4,5) for causing radiation reflected from the spot of impingement on a linear radiation-sensitive detector (6,7)</p><p>A preferred embodiment includes third beam guide means for causing radiation reflected from the spot of impingement to traverse a further path also leading to the detector.</p><p>The second and third beam guide means are structurally different from each other in such a manner that one and the same object spot irradiated by the beam portion is imaged on the detector as two separate, focussed spots spaced a fixed distance from each other. Thereby a reliable discrimination can be made between true and false reflections from the object under inspection.</p>
申请公布号 EP0134597(A1) 申请公布日期 1985.03.20
申请号 EP19840200902 申请日期 1984.06.21
申请人 N.V. OPTISCHE INDUSTRIE "DE OUDE DELFT" 发明人 BECKMANN, LEO HEINRICH JOSEF FRANZ;OOMEN, GIJSBERT LAURENS
分类号 G01C3/06;G01B11/24;G01B11/30;G01C3/00;G01S17/46;(IPC1-7):G01B11/24;G01B11/02 主分类号 G01C3/06
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