发明名称 |
Electromagnetic measuring probe |
摘要 |
An electromagnetic measuring probe for measuring thin layers is specified, in which a pin of low permeability prevents a concentration of field lines in the mounting region. As a result, a display is achieved at low layer thicknesses which is practically linear with respect to the layer thickness. Moreover, practically the same characteristic results for measurements of layer thickness both of highly permeable basic materials and of basic materials with a low permeability.
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申请公布号 |
DE3331407(A1) |
申请公布日期 |
1985.03.14 |
申请号 |
DE19833331407 |
申请日期 |
1983.08.31 |
申请人 |
HELMUT FISCHER GMBH & CO INSTITUT FUER ELEKTRONIK UND MESSTECHNIK, 7032 SINDELFINGEN, DE |
发明人 |
VERZICHT DES ERFINDERS AUF NENNUNG |
分类号 |
G01B7/06;G01N3/42;(IPC1-7):G01B7/10 |
主分类号 |
G01B7/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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