发明名称 PROGRAM TEST DEVICE
摘要 PURPOSE:To detect accurately a cause of an abnormality with simple constitution and to attain ease of program test by designating a range of addresses where an error is generated and its data range. CONSTITUTION:The range of addresses generating an abnormality is set to an address setting circuit 5 of a program test device and a permissible upper limit value and lower limit value of data registers 3a-3n of a computer 1 are set to a comparison data range setting circuit 6. The value of a counter 2 is read by the 1st register circuit 7 at each write instruction to the registers 3a-3n in synchronizing with the updating of the program counter 2 of the computer 1, and the value of the registers 3a-3n being the range of the address set by the circuit 5 is read in the 2nd register circuit 8 synchonizingly. The contents of the circuit 8 and the permissible value set to the circuit 6 are compared by a comparator circuit 6. The contents of the counter 2 stored in the circuit 7 and the contents of the registers 3a-3n stored in the circuit 8 are displayed on a display circuit 10 depending on the result of comparison of the circuit 9 to ease of the program test.
申请公布号 JPS6039253(A) 申请公布日期 1985.03.01
申请号 JP19830147602 申请日期 1983.08.12
申请人 MITSUBISHI DENKI KK 发明人 IWAHASHI KAZUSHI
分类号 G06F11/28;G06F11/36 主分类号 G06F11/28
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