发明名称 |
METHOD FOR WASHING PHOTOMASK |
摘要 |
PURPOSE:To remove contaminants without affecting the light intercepting film of a pattern and without eluting Cr or Cr oxide by carrying out an oxygen plasma treatment process and then carrying out an ultrasonic treatment process in pure water. CONSTITUTION:A photomask is subjected to oxygen plasma treatment to remove its org. contaminants and further subjected to ultrasonic treatment in pure water to remove its inorg. contaminants. Finally, it is dried to remove the pure water. |
申请公布号 |
JPS6039649(A) |
申请公布日期 |
1985.03.01 |
申请号 |
JP19830147302 |
申请日期 |
1983.08.13 |
申请人 |
TOSHIBA KK |
发明人 |
NAKAMURA HATSUO;KATOU CHIHARU;ISHITANI HIROSHI |
分类号 |
B08B3/12;G03F1/00;G03F1/82;H01L21/027 |
主分类号 |
B08B3/12 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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