发明名称 METHOD FOR WASHING PHOTOMASK
摘要 PURPOSE:To remove contaminants without affecting the light intercepting film of a pattern and without eluting Cr or Cr oxide by carrying out an oxygen plasma treatment process and then carrying out an ultrasonic treatment process in pure water. CONSTITUTION:A photomask is subjected to oxygen plasma treatment to remove its org. contaminants and further subjected to ultrasonic treatment in pure water to remove its inorg. contaminants. Finally, it is dried to remove the pure water.
申请公布号 JPS6039649(A) 申请公布日期 1985.03.01
申请号 JP19830147302 申请日期 1983.08.13
申请人 TOSHIBA KK 发明人 NAKAMURA HATSUO;KATOU CHIHARU;ISHITANI HIROSHI
分类号 B08B3/12;G03F1/00;G03F1/82;H01L21/027 主分类号 B08B3/12
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