发明名称 X-RAY TOPOGRAPH METHOD
摘要 PURPOSE:To enable the sharp image pick-up of an individual transition line, by interposing a spectral crystal between a specimen and an image pick-up film and diffracting diffraction X-ray from the specimen by the spectral crystal to allow the same to be incident on the image pick-up film. CONSTITUTION:Incident X-rays 1 issued from an X-ray source is incident on a single crystal 3 through a slit 2 so as to form a special angular expanse for several min and diffracted at a Bragg angle thetaB to generate emitted X-rays 4. The single crystal 3 is scanned in parallel to a direction shown by the arrow. Diffracted rays 4 of X-rays incident on a perfect crystal part A generate a sharp peak and diffracted rays 4' having a wide width are generated in the vicinity containing a transition line B. Diffracted X-rays 4 are incident on a spectral crystal 5 at an incident angle of thetaM and emitted at the same diffraction angle to be incident on an image pick-up film 7 as diffracted rays 6, 6'. Because the spectral crystal 5 is interposed, the width of the diffracted rays of the transition line becomes narrow and the sharp image pick-up of the transition line is enabled.
申请公布号 JPS6038643(A) 申请公布日期 1985.02.28
申请号 JP19830146924 申请日期 1983.08.11
申请人 NIPPON DENKI KK 发明人 MATSUI JIYUNJI
分类号 G01N23/205;(IPC1-7):G01N23/205 主分类号 G01N23/205
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