发明名称 AUTOMATED MICROSCOPY SYSTEM AND METHOD FOR LOCATING AND RE-LOCATING OBJECTS IN AN IMAGE
摘要 <p>A microscopy method for automatically locating objects-of-interest in a two or three dimensional image having one or more objects against a background, where each of the objects-of-interest is characterized by a predetermined set of features. The method comprises the steps of identifying objects by scanning the image and detecting one or more of the objects during said scanning, identifying ones of the identified objects having the predetermined set of features as objects-of-interest, and generating a marker signal for an identified object-of interest. The marker signal has a feature portion representative of the predetermined set of features of the identified object-of-interest, and a pattern portion representative of the relative distance and relative orientation of a plurality of detected objects neighboring the identified object-of-interest.</p>
申请公布号 CA1183266(A) 申请公布日期 1985.02.26
申请号 CA19830425796 申请日期 1983.04.13
申请人 COULTER ELECTRONICS, INC. 发明人 GRAHAM, MARSHALL D.;COOK, DAVID D., JR.
分类号 G02B21/00;G01N21/17;G01N33/48;G02B21/36;G06K9/00;(IPC1-7):G06K9/00 主分类号 G02B21/00
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