| 摘要 |
PURPOSE:To sort the racks of semiconductor devices as one handling unit, and to increase actually working time of an expensive tester by a method wherein printed substrates of the plural number loading with the measuring semiconductor devices of a large number are inserted in a magazine dolly having sockets to be connected electrically to an outside circuit. CONSTITUTION:Measuring semiconductor devices 1 of a large number and a PROM element 3 to be written with measured data thereof are loaded on a printed substrate 2 having outside connecting contact conductors 2a to be inserted into sockets 5a on a mother board 5 provided to a magazine dolly 4. While the mother board 5 to make the substrates 2 to stand upright interposing an interval between them and to be accommodated is provided in the outside construction 6 of the dray 4, the sockets 5a are fitted thereto, and connecting conductors 8 are led out therefrom through a repeater unit 7. Moreover, casters 9 are provided to the base of the outside construction 6 to make the dray 4 transference freely. Taking in and out of the substrates 2 is simplified by constructing the sorting device in such a way, and working efficiency of a tester is enhanced. |
