发明名称 INSPECTING CIRCUIT
摘要 PURPOSE:To observe signals on plural signal lines at one output terminal by using gate electrodes of >=1 insulating gate type field-effect transistors (FET) as input electrodes, connecting them to corresponding signal lines and observing the signals. CONSTITUTION:The sources and drains of N channel insulating gate type FETs 6-9 are connected in parallel; and a DC bias power source 10 is connected to the sources and an ammeter 11 is connected to a DC bias power source 10. Then, the signals on four signal lines are inputted to the gates of the FETs 6-9 through input terminals 1-4. If the signal inputted from the input terminal 1 is ''1'', the drain current of the FET6 is 8I, and those of other FETs are 4I, 2L, and I respectively. The current of the ammeter 11 connected to an output terminal 5 is therefore the total of the drain currents of the FETs 6-9 and the signals on the plural signal lines are observed at one output terminal.
申请公布号 JPS6033067(A) 申请公布日期 1985.02.20
申请号 JP19830141158 申请日期 1983.08.03
申请人 NIPPON DENKI KK 发明人 KIKUCHI KOUICHI
分类号 G01R31/28;(IPC1-7):G01R31/28 主分类号 G01R31/28
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