Circuit for DC testing of logic circuits.

摘要

Logic circuits such as cascode circuits can be DC tested for normally untestable defects, such as emitter shorts or collector opens, by applying to the output of the circuit (lines 16, 17), or portion of the circuit, under test an additional voltage (at 50, 51) through an impedance. The specific embodiment teaches a resistor (42, 43) and diode (44, 45) in series as the impedance.