发明名称 INSPECTING METHOD AND DEVICE BY NUCLEAR MAGNETIC RESONANCE
摘要 PURPOSE:To obtain fault images of plural slice surfaces related to a specified atomic nucleus distribution, etc. in a body to be inspected, in a short time, by changing forcibly a direction of a magnetization M by three kinds of pulse sequences, and also executing the same method as to another slice surface, within a time when the magnetization M is returned to a thermal balance state. CONSTITUTION:A sequence is executed immediately by selecting other slice surfaces B, C which are different from a slice surface A and are not influenced by a state of magnetization of the slice surface A, by changing a value of offset, without waiting for even a time when a magnetization M of the slice surface A coincides with a Z' axis. That is to say, the value of offset is changed to SB from SA, the slice surface B is selected, a 90 deg. pulse is applied immediately, and after a tau time has elapsed, a (180 deg.-x) pulse is applied, and subsequently, after a tau time has elapsed, a 90 deg. pulse is applied. In the same way, the value of offset is changed to SC from SB, other slice surface C which is different from the slice surface A and B, and is not influenced by a state of magnetization of each slice surface is selected, and a sequence No.3 is executed. In this way, one projection signal of a projecting direction alpha1 is obtained with regard to (n) pieces of slice surfaces A-N, respectively.
申请公布号 JPS6029684(A) 申请公布日期 1985.02.15
申请号 JP19830136950 申请日期 1983.07.27
申请人 YOKOKAWA HOKUSHIN DENKI KK 发明人 IWAOKA HIDETO;SUGIYAMA SUNAO;MATSUURA HIROYUKI
分类号 G01R33/20;A61B5/055;A61B10/00;G01N24/08;G01N33/50;G01R33/48;G01R33/561 主分类号 G01R33/20
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