| 摘要 |
Automatic device for statistical analysis of an object (1), comprising (a) a microscope (4) for projecting the image of an elementary part of the object (1) onto a photoelectric receiver (5), the object (1) and the receiver (5) being displaceable relative to one another, continuously, at constant speed, so that the images of different elementary parts of the object (1) are projected continuously onto the receiver (5); (b) an electronic circuit (7) for continuously digitizing each of the images, followed by a single computer (8) for continuously storing and then for continuously processing these images, making it possible to characterize the latter by a limited number of parameters; and (c) a microprocessor (10) for storage of these parameters and then for statistical calculations by means of all the stored parameters for an average characterization of the object (1) under study. |
