| 摘要 |
PURPOSE:To obtain the result of determination of a composition without using a calibration curve and a standard sample, by computing a strength based on the result of qualitative analysis of an unknown sample by an X-ray diffraction method, computing a peak profile by a specified method, and comparing the profile with the actually measured value of the strength, which is corrected with LP. CONSTITUTION:The qualitative analysis of an nuknown sample is performed by an X-ray diffraction method. The strength computation is performed by using atomic coordinates, atom scattering factors, and the like based on the result of the analysis. A corrected Lorentz function is applied to each strength value, and the line profile of a peak is computed. The result is compared with the actually measured value, which is corrected with LP, and the result of the determination of a composition is obtained. Thus the result of the determination of the composition is obtained without using a calibrating curve and a standard sample. |
