| 摘要 |
A circuit for adjusting the sweep time provided by a sweep generator used in an ultrasonic test instrument is described. The adjustment takes into account three test parameters, i.e. the angle of propagation of the sound in the workpiece, the speed of propagation of sound in the workpiece, and the thickness of the workpiece. To this end, the quartz-stabilized frequency of an oscillator comprising an adjustable frequency divider is divided by the angle function value of the angle of sound propagation to which the test instrument is set. The divided frequency is fed to a frequency multiplier in a phase locked loop circuit, comprising an adjustable frequency divider by means of which the speed of propagation of the sound is adjusted. A succeeding time reference stage contains also an adjustable frequency divider by means of which the workpiece thickness is adjusted. The duration of rectangular pulses generated by the time reference stage takes into account the three adjusted parameters with the same relative accuracy as that preset by the quartz-stabilized oscillator. The duration of the rectangular pulse generated by the time reference stage is equal to the sweep time.
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