发明名称 THIN FILM FORMING DEVICE PROVIDED WITH OPTICAL INTERFERENCE TYPE FILM THICKNESS MONITOR
摘要 PURPOSE:To realize a clear detection with a simple structure by placing a reflector and a light transmitting plate in a gap between plural substrates placed on a substrate holder, and using reflected light for detecting a synchronizing signal. CONSTITUTION:Monochromatic light for monitoring an optical interference, projected from a laser light source 1 is reflected by mirrors 41, 42- provided between plural substrates 51, 52- on a substrate holder 55 rotating around a shaft 10, and reaches a synchronizing signal detecting sensor 64. An optical path reaching a regular optical interference monitoring sensor 6 is path of measuring light reflected by the surface of the substrate 51, etc.
申请公布号 JPS6020106(A) 申请公布日期 1985.02.01
申请号 JP19830128166 申请日期 1983.07.14
申请人 NICHIDEN ANELVA KK 发明人 FUKUSHIMA SHIROU
分类号 C23C14/54;G01B11/06 主分类号 C23C14/54
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