METHOD OF MEASUREMENT OF THERMAL RESISTANCE OF BIPOLAR TRANSISTORS,申请号PL19800224963-传众专利搜索

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发明名称	METHOD OF MEASUREMENT OF THERMAL RESISTANCE OF BIPOLAR TRANSISTORS
摘要
申请公布号	PL132113(B1)	申请公布日期	1985.01.31
申请号	PL19800224963	申请日期	1980.06.14
申请人		发明人
分类号	G01R;G01R31/26;(IPC1-7):G01R31/26	主分类号	G01R
代理机构		代理人
主权项
地址

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