发明名称 ELECTRON BEAM ANNEALER
摘要 PURPOSE:To improve uniformity and reproducibility by a method wherein a Faraday cup, which has an aperture whose diameter is smaller than that of a beam, is provided to a prescribed position near a specimen and at least one of an electron gun or a lens system is controlled so as to make the detected maximum beam current constant. CONSTITUTION:A Faraday cup 11 whose aperture diameter is far smaller than that of an electron beam is provided to an edge of a stage on which a specimen 5 is placed. Captured electrons flow through an ammeter 12 and a beam current at a peak part of the beam is detected. Every time the specimen 5 is scanned, the Faraday cup 11 is scanned and the maximum value of a current signal synchronized with it is measured. This measured value is used as a feedback signal and controls lens driving circuits 8, 9 so as to make the measured value constant by optimizing a beam focus.
申请公布号 JPS6017913(A) 申请公布日期 1985.01.29
申请号 JP19830124695 申请日期 1983.07.11
申请人 KOGYO GIJUTSUIN (JAPAN) 发明人 INOUE TOMOYASU
分类号 H01J37/26;H01L21/26;H01L21/263;(IPC1-7):H01L21/26 主分类号 H01J37/26
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