发明名称 METHOD FOR PRODUCTION OF DRAM
摘要 <p>The manufacturing method for the volatile DRAM having a trench type capacitor and a stack type capacitor on a single substrate, comprises the steps of forming a trench type capacitor structure: etching a region for connecting between the N+ type impurity doped region (2) and a buried dielectric region (3); coating a polysilicon layer thereon to form a charge storing electric layer (9) by using a photomasking process; forming a dielectric film (10) on the layer (9); and forming a plate electrode layer (11) thereon.</p>
申请公布号 KR910002306(B1) 申请公布日期 1991.04.11
申请号 KR19880004644 申请日期 1988.04.23
申请人 SAM SUNG ELECTRONICS CO.,LTD. 发明人 SONG, CHANG-RYONG;AN, TAE-HYOG;HAN, MIN-SOG
分类号 H01L27/108;(IPC1-7):H01L27/108 主分类号 H01L27/108
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