发明名称 STROBE ELECTRON BEAM DEVICE
摘要 PURPOSE:To enable to observe the internal voltage waveform of a sample even if the time stability of a clock pulse is insufficient except an accurate delay unit by providing an arbitrary clock pulse in a repetition period of the observing time origin. CONSTITUTION:An electron optical barrel 1 emits an electron beam to the observing point of a sample 3 placed in a sample chamber 2. The production of an electron beam is controlled by a pulse driver 6. A pulse generator 7 responses to signals on lines 8-11. The counted output of a counter 20 is connected to one input of a comparator 21, and the set output of a register 22 is connected to the other input. The output of the comparator 21 is connected to a variable delay unit 23. A control counter 14 outputs a clock pulse number designation signal and a time designation signal. The output of the secondary electron detector 13 is connected through a signal processor 16 for addition-averaging it to the counter 14. An electron beam emitting timing pulse is supplied through a line 17 from the generator 7.
申请公布号 JPS6010636(A) 申请公布日期 1985.01.19
申请号 JP19830119047 申请日期 1983.06.30
申请人 FUJITSU KK 发明人 GOTOU YOSHIAKI;OZAKI KAZUYUKI;ISHIZUKA TOSHIHIRO;ITOU AKIO;FURUKAWA YASUO
分类号 H01J37/26;G01R31/302;H01L21/66;(IPC1-7):H01L21/66 主分类号 H01J37/26
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