发明名称 SHAPE EXAMINING DEVICE
摘要 <p>PURPOSE:To examine automatically a wire loop shape by attaining deviations of wire positions in plane and side images from reference wire positions after positioning a wire in accordance with the plane image. CONSTITUTION:A rotary stage is rotated at an angle to move a wire 46 to be examined to such image pickup position that the wire 46 is vertical to a TV camera. A deviation DELTAd between the wire 46 to be examined and a reference wire position 51 is attained on a basis of a wire image (plane image) signal picked up by a TV camera A3 and is compared with a standard value to detect disconnection and mutual approximation or wires. A deviation DELTAn between the wire 46 to be examined and a reference wire position 52 is attained on a basis of a wire image (side image) signal picked up by a TV camera B7 and is compared with a standard value to detect defects such as a sag of the wire, contacting with another object such as an IC chip 44, a package 41, etc. or the like.</p>
申请公布号 JPS608706(A) 申请公布日期 1985.01.17
申请号 JP19830115871 申请日期 1983.06.29
申请人 FUJITSU KK 发明人 TSUKAHARA HIROYUKI;NAKAJIMA MASAHITO
分类号 G01N21/88;G01B11/24;G01N21/93;G01N21/956;H01L21/98;H05K13/06;(IPC1-7):G01B11/24 主分类号 G01N21/88
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