发明名称 METHOD FOR MEASURING THICKNESS OF THIN LAYER ON INNER SURFACE OF PIPE UTILIZING X-RAY CT
摘要 PURPOSE:To measure the thickness of a lining material accurately, by measuring a thin-layer lined pipe, which is a body to be checked, through a thin layer of a high-density material, whose X-ray absorption coefficient is higher than those of the base material of a pipe and the lining material, by an expanded X-ray CT method. CONSTITUTION:An X-ray source 22 for expanding and picking up an image, whose size of focal point is small, is provided on the inner wall of a tunnel 21 of an X-ray CT apparatus. Many X-ray detectors 23,... are provided on the surface of a wall, on which X rays are projected. The thin film of a heavy metal such as tungsten or platinum is provided between a zircaloy pipe and a zirconium-lining thin layer. In a body to be checked 1, which is an atomic fuel pipe. The body to be checked is arranged in a CT tunnel 21. At this time, the center of the axis of the body to be checked 1 is deviated from the center of the axis of the CT tunnel 21 to the side of the X-ray source 22. With the body to be checked 1 being rotated as an arrow, the X rays are projeted. The doses, which are detected by the X-ray detectors 23,..., are inputted to a computer, and a tomograph is formed.
申请公布号 JPS607312(A) 申请公布日期 1985.01.16
申请号 JP19830116504 申请日期 1983.06.28
申请人 MITSUBISHI JUKOGYO KK 发明人 YOSHIDA YOSHIMICHI;KAMIMURA TAKEO
分类号 G01B15/02;G01N23/04 主分类号 G01B15/02
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