| 摘要 |
PURPOSE:To enable to execute simply the test of a semiconductor memory circuit device without using an expensive and complicated tester by a method wherein the circuit having a test faculty is built in the memory circuit chip. CONSTITUTION:When an oscillating condition signal is selected by an input terminal 5, a self oscillating circuit 1 outputs a signal from a first signal terminal S1. The output terminals Q0-Qn-1 of a binary counter circuit 2 to count the output signals of the circuit 1 thereof output signals respectively, and a memory circuit 3 is addressed according to the signals thereof. Moreover the circuit 3 can select respectively a writable condition and a readable condition accordint to the signal of an input terminal 8. When the condition of the terminal 8 is in the writable condition, the second signal terminal S2 of the circuit 1 outputs a signal necessary for writing, and the data signal of an input terminal 7 is written to the circuit 3. Moreover, when the condition of the terminal 8 is in the readable condition, the output signal of the terminal D0 of the circuit 3 and the input signal of the terminal 7 are sent to a correct and erroneous action judging circuit 4, and signals corresponding respectively to normal action and erroneous action are outputted from an output terminal 6. |
