发明名称 PROCESS OF FORMING A POLYCRYSTALLINE SILICON PATTERN
摘要 A process of forming a polycrystalline silicon pattern which is used for a semiconductor device, wherein the degree of side etching is low and the obtained pattern is of high precision. Firstly, a polycrystalline silicon layer is deposited on a semiconductor substrate or on an insulating film which is formed on a semiconductor substrate. An impurity is selectively ion-implanted with high concentration into the region in the layer which is to remain as a polycrystalline silicon pattern. Finally, whole of the polycrystalline silicon layer into which the impurity is thus selectively ion-implanted is plasma-etched to etch off the areas into which the impurity is not ion-implanted.
申请公布号 DE3167348(D1) 申请公布日期 1985.01.03
申请号 DE19813167348 申请日期 1981.12.24
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 KOMATSU, SHIGERU;KAMIYA, MICHIO
分类号 H01L21/3213;H01L21/3215;(IPC1-7):H01L21/28;H01L21/30;H01L21/26 主分类号 H01L21/3213
代理机构 代理人
主权项
地址