发明名称 Plasma developable negative resist compositions for electron beam, X-ray and optical lithography.
摘要 <p>A negative resist composition including a polymeric matrix material, a polymerizable monomer, and an onium salt radiation sensitive initiator. The monomer is polymerized by irradiating the resist with an e-beam, x-ray, or ultraviolet source and heating the exposed resist. The resist is developed by a dry etchant such as plasma or a reactive ion etchant.</p>
申请公布号 EP0130088(A2) 申请公布日期 1985.01.02
申请号 EP19840304359 申请日期 1984.06.27
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 SHU, JING SHING;COVINGTON, JOHNNY B.;LEE, WEI;VENABLE, LARRY G.;VARNELL, GILBERT L.
分类号 G03F7/20;C08F2/00;C08F2/50;G03C5/08;G03F7/029;G03F7/033;G03F7/038;H01L21/027;(IPC1-7):G03C1/68 主分类号 G03F7/20
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