发明名称 TEMPERATURE PATTERN MEASURING METHOD AND A DEVICE THEREFOR
摘要 A temperature pattern distribution measuring method and apparatus by which portions of light from parts of an area of an object whose temperature distribution pattern is to be measured, and whose parts are in a predetermined pattern are passed through first and second optical filters which respectively pass different wavelengths of light. The level of energy passed by the respective filters for the respective portions of light are determined by scanning the light from the filters with a pickup device or devices.
申请公布号 KR840002371(B1) 申请公布日期 1984.12.24
申请号 KR19810000671 申请日期 1981.03.02
申请人 SUMITOMO METAL IND.CO.LTD 发明人 TATSUWAKI MASAO;NEMOTO SHIN;OKUHARA SEIICHI
分类号 G01J5/18;G01K13/10;(IPC1-7):G01J5/18 主分类号 G01J5/18
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