| 摘要 |
PURPOSE:To complete upto a DC test for a relative short time by adding a DC parametric testing circuit to a test head of an IC tester to perform a DC parametric testing as intact with a logic IC tester. CONSTITUTION:When a DC measuring function is added to a driver and a comparator, a higher speed of the drive and the comparator are not possible and hence, a hybrid IC-converted and miniaturized DC measuring section 3 as discrete unit is carried on a pin electronics. When the pin electronics is used as intrinsic high-speed driver and comparator, a switching relays 5 and 6 are connected to the position (a) to turn OFF an opening/closing relay 7. When the pin electronics is used as DC measuring device, switching relays 5 and 6, are connected to the position (b) to turn ON the opening/closing relay 7. With such an arrangement, the time required for an IC test including a DC parametric test can be reduced significantly.
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