发明名称 |
Means and method for determining residual stress on a polycrystalline sample by X-ray diffraction |
摘要 |
A polycrystalline sample is irradiated with a collimated beam of substantially monochromatic X-ray radiation to form a diffraction come which extends and expands outwardly from the sample. A substantially planar, two-dimensional, position sensitive detector is disposed across the cone to intercept and thereby form a two-dimensional image of at least a substantial portion of the cone's cross-sectional periphery. A theoretical relationship exists between the shape of the cone's image and the residual stress in the sample such that the image can be analyzed to quantitatively determine the residual stress.
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申请公布号 |
US4489425(A) |
申请公布日期 |
1984.12.18 |
申请号 |
US19830453809 |
申请日期 |
1983.01.14 |
申请人 |
SCIENCE APPLICATIONS, INC. |
发明人 |
BORGONOVI, GIANCARLO |
分类号 |
G01N23/207;(IPC1-7):G01N23/20 |
主分类号 |
G01N23/207 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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