发明名称 TEST SIGNAL GENERATOR
摘要 PURPOSE:To obtain a test signal generator suitable for a high sharpness television receiver by providing a means storing a pattern section and a frame waveform pattern forming means. CONSTITUTION:A pattern section storage means 25 stores plural pattern sections representing a selected part of a frame waveform pattern from a patten ROM38. Then a frame waveform pattern forming means 44 retrieves the stored pattern sections and forms a series of pattern sections representing the entire frame in a real time by repeating (or storing) the pattern sections in a prescribed order. This series of pattern sections is converted into a test signal by converting means 14A-14D and 16A-16D. The test signal generator suitable for a high sharpness television receiver is obtained in this way.
申请公布号 JPS59224981(A) 申请公布日期 1984.12.17
申请号 JP19840069685 申请日期 1984.04.06
申请人 SONY KK 发明人 DONARUDO II MOOGAN
分类号 H04N17/00;H04N17/02;H04N17/04;(IPC1-7):H04N5/13 主分类号 H04N17/00
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