发明名称 CHARGED PARTICLE IRRADIATION APPARATUS
摘要 PROBLEM TO BE SOLVED: To obtain a high intensity and short time irradiation type charged particle irradiation apparatus capable of shortening an irradiation time to reduce the load and dangerousness to a patient. SOLUTION: A charged particle irradiation source is equipped with a radiation source for supplying a plurality of charged particle beams 1A, 1B different in energy from each other, a deflection electromagnet 10 deflecting a plurality of the charged particle beams 1A, 1B in the radii of curvature corresponding to the respective energies thereof, a transport system for introducing a plurality of the charged particle beams 1A, 1B into the deflection electromagnet 10 at the different introducing angles corresponding to the energies of both beams and an irradiation system 11 for irradiating an object to be irradiated with the charged particle beam 6 emitted from the deflection electromagnet 10 and constituted so as to deflect a plurality of the charged particle beams 1A, 1B different in energy from each other by the deflection electromagnet 10 to synthesize the beams to an almost same track before emitting them.
申请公布号 JP2000354637(A) 申请公布日期 2000.12.26
申请号 JP19990168562 申请日期 1999.06.15
申请人 MITSUBISHI ELECTRIC CORP 发明人 MIZOTA MANABU
分类号 H01J37/147;A61N5/10;G21K5/04;(IPC1-7):A61N5/10 主分类号 H01J37/147
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