| 摘要 |
For error testing and diagnostics in EDP systems, particular storage elements (e.g., 6) are connected to form an addressable matrix which is coupled to a maintenance and service processor (5) or an external tester through the system bus (9). During normal operation, the logic subsystems (10), of which processors (1) and processing units consist, are connected by the storage elements. Through the system bus, the maintenance and service processor or the tester transfers addresses to the matrix and test data to the addressed storage elements from where they are fed to the logic subsystems which in turn respond to such test data, transferring the (partial) result data thus received to the storage elements. In the next step, the maintenance and service processor or the external tester causes the result data for error analysis and diagnostics to be fetched through the system bus from the storage elements reconnected in the form of a matrix. |
