JIG AND TOOL FOR TESTING SEMICONDUCTOR, SEMICONDUCTOR TEST SYSTEM, AND SEMICONDUCTOR TEST METHOD

摘要

PROBLEM TO BE SOLVED: To prevent data processing from performing overhead operation in a test of a semiconductor device without providing a test result memory in a semiconductor test device. SOLUTION: In a semiconductor test system testing a semiconductor device 1 having a self-diagnosis circuit 5 performing relief analysis of a memory circuit 4 by performing self-diagnosis of the incorporated memory circuit 4, the system is provided with a jig and tool 2 for testing a semiconductor connecting electrically the semiconductor device 1 and a semiconductor test device 3, and a non-volatile memory 9A for taking in and holding test result data outputted from the self-diagnosis circuit 5.