发明名称 |
SURFACE INSPECTING APPARATUS |
摘要 |
PURPOSE:To accurately inspect the defect position of an object to be inspected, by storing detection data in the predetermined position of a memory part determined by a value based on the distance from a detector to measure the same in an operation processing part. CONSTITUTION:When a shearing system is operated and a coil E begins to advance, the inspection of the coil E is performed by various detectors D1-Dn. The detection data from the various detectors D1-Dn are inputted to a central processing apparatus A every when the coil E advances over a unit length (u) by the pulse signal from a pulse generator PG. The inputted detection data is stored in a slot through input circuits H1-Hn corresponding to the various detectors D1-Dn by the deviation of a pointer being the value obtained by dividing the distance from an input reference point S to the various detectors D1-Dn by the unit length (u) and read in a data editing part 12 on the basis of the indication of said slot. The data editing part 12 calculates the total number of defects K in the coil E which have passed on the basis of the read detection data.
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申请公布号 |
JPS59220603(A) |
申请公布日期 |
1984.12.12 |
申请号 |
JP19830095247 |
申请日期 |
1983.05.30 |
申请人 |
TOSHIBA KK |
发明人 |
EJIMA YASUJI;TOSHIMITSU KOUJI |
分类号 |
G01N27/82;G01B7/28;G01B7/34;G01N21/88;G01N29/44 |
主分类号 |
G01N27/82 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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